Crossover between fractal and nonfractal flux penetration in high-temperature superconducting thin films

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Crossover between fractal and nonfractal flux penetration in high-temperature superconducting thin films

Journal Article (1998)

Author(s)

R. Surdeanu (Vrije Universiteit Amsterdam, Institute COMPAS)

R. Wijngaarden (Vrije Universiteit Amsterdam, Institute COMPAS)

B. Dam (Institute COMPAS, Vrije Universiteit Amsterdam)

J. Rector (Vrije Universiteit Amsterdam, Institute COMPAS)

R. Griessen (Institute COMPAS, Vrije Universiteit Amsterdam)

C. Rossel (IBM Research)

Z.F. Ren (State University of New York at Buffalo)

J.H. Wang (State University of New York at Buffalo)

Affiliation

External organisation

DOI related publication

https://doi.org/10.1103/PhysRevB.58.12467 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:9c9a620b-8361-4432-8c5a-68783c1cc75f

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Publication Year

1998

Language

English

Affiliation

External organisation

Journal title

Physical Review B - Condensed Matter and Materials Physics

Issue number

18

Volume number

58

Pages (from-to)

12467-12477

Downloads counter

95

Abstract

In this study the role of anisotropy on flux penetration in c-axis epitaxial Tl2⁢Ba2⁢CuO6+𝑥 and YBa2⁢Cu3⁢O7−𝑥 films is investigated by magneto-optics. We study thin films of Tl2⁢Ba2⁢CuO6+𝑥 on substrates with vicinal angles of 0° (well-oriented), 0.5°, 2.5°, and 4° and YBa2⁢Cu3⁢O7−𝑥 films as a function of chain-conduction-induced anisotropy. A crossover from fractal to nonfractal flux penetration is observed with increasing anisotropy. Numerical simulations of anisotropic flux motion are compared with experiment.