Adaptive optics for confocal laser scanning microscopy with adjustable pinhole

Conference Paper (2016)
Author(s)

H.W. Yoo (Technische Universität Wien)

M.E. van Royen (Erasmus MC)

WA van Cappellen (Erasmus MC)

AB Houtsmuller (Erasmus MC)

M.H.G. Verhaegen (TU Delft - Team Raf Van de Plas)

G Schitter (Technische Universität Wien)

Research Group
Team Raf Van de Plas
Copyright
© 2016 H.W. Yoo, M.E. van Royen, WA van Cappellen, AB Houtsmuller, M.H.G. Verhaegen, G Schitter
DOI related publication
https://doi.org/10.1117/12.2227775
More Info
expand_more
Publication Year
2016
Language
English
Copyright
© 2016 H.W. Yoo, M.E. van Royen, WA van Cappellen, AB Houtsmuller, M.H.G. Verhaegen, G Schitter
Research Group
Team Raf Van de Plas
Volume number
9887
ISBN (print)
978-1-510601321
Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Abstract

The pinhole plays an important role in confocal laser scanning microscopy (CLSM) for adaptive optics (AO) as well as in imaging, where the size of the pinhole denotes a trade-off between out-of-focus rejection and wavefront distortion. This contribution proposes an AO system for a commercial CLSM with an adjustable square pinhole to cope with such a trade-off. The proposed adjustable pinhole enables to calibrate the AO system and to evaluate the imaging performance. Experimental results with fluorescence beads on the coverslip and at a depth of 40 μm in the human hepatocellular carcinoma cell spheroid demonstrate that the proposed AO system can improve the image quality by the proposed calibration method. The proposed pinhole intensity ratio also indicates the image improvement by the AO correction in intensity as well as resolution.

Files

988739.pdf
(pdf | 1.95 Mb)
License info not available