A MEMS reactor for atomic-scale microscopy of nanomaterials under industrially relevant conditions
Journal Article
(2010)
Author(s)
Fredrik Creemer (TU Delft - Electronic Components, Technology and Materials)
S Helveg (External organisation)
PJ Kooyman (TU Delft - ChemE/Catalysis Engineering)
AM Molenbroek (External organisation)
H. W. Zandbergen (QN/High Resolution Electron Microscopy)
Pasqualina Sarro (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:9f1f9247-6369-45b1-9cb1-ffbe0b9035dd
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Publication Year
2010
Language
English
Research Group
Electronic Components, Technology and Materials
Issue number
2
Volume number
19
Pages (from-to)
254-264
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