Design for Reliability of Wafer Level MEMS packaging
Doctoral Thesis
(2012)
Author(s)
JJM Zaal (TU Delft - Computational Design and Mechanics)
Research Group
Computational Design and Mechanics
To reference this document use:
https://resolver.tudelft.nl/uuid:a1802713-e532-4104-855e-0a8a71d58e44
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Publication Year
2012
Language
English
Research Group
Computational Design and Mechanics
ISBN (print)
9789491104114
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