Sampling inspection for the evaluation of time-dependent reliability of deteriorating systems under imperfect defect detection
Journal Article
(2009)
Author(s)
SP Kuniewski (External organisation)
J.A.M. van der Weide (TU Delft - Applied Probability)
JM van Noortwijk (TU Delft - OLD Operations Research and Risk Analysis)
Research Group
Applied Probability
To reference this document use:
https://resolver.tudelft.nl/uuid:a6445983-b4b1-43b1-b760-c009a0b02779
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Publication Year
2009
Research Group
Applied Probability
Volume number
94
Pages (from-to)
1480-1490
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