Sampling inspection for the evaluation of time-dependent reliability of deteriorating systems under imperfect defect detection

Journal article (2009)

Authors

SP Kuniewski External organisation
J.A.M. van der Weide Applied Probability - EEMCS
JM van Noortwijk OLD Operations Research and Risk Analysis
Research Group
Applied Probability (EEMCS) (TU Delft)
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Published Date

2009

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Delft Institute of Applied Mathematics

Research Group

Applied Probability