Data driven fault detection with robustness to uncertain parameters identified in closed loop
Conference Paper
(2010)
Author(s)
J Dong (TU Delft - Electronic Components, Technology and Materials)
M. Verhaegen (TU Delft - DISC)
M Gustafsson (External organisation)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:a68cb8cf-e240-4981-829c-84c57fb0750e
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Publication Year
2010
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
750-755
ISBN (print)
978-1-4244-7744-9
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