Towards contactless scanning thermal microscopy
measuring probe-sample separation
Abstract
(2018)
Author(s)
Roy Bijster (TU Delft - Computational Design and Mechanics, TNO)
H. Sadeghian (TNO, Eindhoven University of Technology)
F. van Van Keulen (TU Delft - Computational Design and Mechanics)
Research Group
Computational Design and Mechanics
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Publication Year
2018
Language
English
Research Group
Computational Design and Mechanics
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