Simulating multiple diffraction in imaging systems using a path integration method

Journal Article (2016)
Author(s)

B.M. Mout (TU Delft - ImPhys/Optics)

Michael Wick (Carl Zeiss)

F Bociort (TU Delft - ImPhys/Optics)

Joerg Petschulat (Carl Zeiss)

Paul Urbach (TU Delft - ImPhys/Optics)

Research Group
ImPhys/Optics
Copyright
Campus only
DOI related publication
https://doi.org/10.1364/AO.55.003847
More Info
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Publication Year
2016
Language
English
Copyright
Campus only
Research Group
ImPhys/Optics
Issue number
14
Volume number
55
Pages (from-to)
3847-3853

Abstract

We present a method for simulating multiple diffraction in imaging systems based on the Huygens–Fresnel principle. The method accounts for the effects of both aberrations and diffraction and is entirely performed using Monte Carlo ray tracing.We compare the results of this method to those of reference simulations for field propagation through optical systems and for the calculation of point spread functions. The method can accurately model a wide variety of optical systems beyond the exit pupil approximation.

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