Improved risk analysis through failure mode classification accoring to occurence time

Conference paper (2012)

Authors

R.P.Y. Mehairjan OLD High-Voltage Technology and Management

Q. Zhuang OLD High-Voltage Technology and Management

D. Djairam OLD High-Voltage Technology and Management

J.J. Smit OLD High-Voltage Technology and Management

Research Group

OLD High-Voltage Technology and Management

More Info

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http://resolver.tudelft.nl/uuid:a858c695-84a1-41cb-95b9-6d2e4444cebf

Published Date

2012

Language

English

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Research Group

OLD High-Voltage Technology and Management