Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction da ta

Müller, K; Schowalter, M; Jansen, J.; Tsuda, K; Titantah, J

Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction da ta

Journal article (2009)

Authors

K Müller External organisation

M Schowalter External organisation

J. Jansen QN/High Resolution Electron Microscopy

K Tsuda External organisation

J Titantah External organisation

Research Group

QN/High Resolution Electron Microscopy

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Published Date

2009

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Research Group

QN/High Resolution Electron Microscopy

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