Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction da ta

Journal article (2009)

Authors

K Muller External organisation
M Schowalter External organisation
J. Jansen QN/High Resolution Electron Microscopy
K Tsuda External organisation
J Titantah External organisation
Research Group
QN/High Resolution Electron Microscopy
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Published Date

2009

Language

Undefined/Unknown

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Research Group

QN/High Resolution Electron Microscopy