Measuring onion cultivars with image analysis using inflection points
Journal Article
(1996)
Author(s)
GWAM van der Heijden (External organisation)
AM Vossepoel (TU Delft - ImPhys/Quantitative Imaging)
G Polder (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
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https://resolver.tudelft.nl/uuid:a9f37a77-92fa-42bf-b3d1-f571cd8da722
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Publication Year
1996
Research Group
ImPhys/Quantitative Imaging
Volume number
87
Pages (from-to)
19-31
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