Improved modeling of output conductance and cut-off frequency of bipolar transistors

Conference Paper (2000)
Author(s)

JCJ Paasschens (External organisation)

WJ Kloosterman (External organisation)

RJ Havens (External organisation)

HC de Graaff (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

Research Group
Old - EWI Ch. Integrated Sensing Devices
More Info
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Publication Year
2000
Research Group
Old - EWI Ch. Integrated Sensing Devices
Pages (from-to)
62-65
ISBN (print)
0-7803-6384-1

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