Electromagnetic Analysis of Nanoscale Heterogeneity
The Domain-Integrated Perspective
Ioan E. Lager (TU Delft - Electrical Engineering, Mathematics and Computer Science)
Guy A.E. Vandenbosch (Katholieke Universiteit Leuven)
Martin Stumpf (Brno University of Technology)
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Abstract
This paper introduces a new paradigm in the electromagnetic (EM) analysis of largely inhomogeneous nanostructures. It is shown that the high degree of inhomogeneity may render the traditional discretisation of such topologies problematic. A new discretisation scheme that is much better matched to these topologies is proposed. The scheme involves a more adequate meshing and discretisation formalism, in conjunction with an original combination of dual space-time EM field quantities to be calculated. The pivotal field equations are elaborately discussed, with an emphasis on their computational implications.