Electromagnetic Analysis of Nanoscale Heterogeneity

The Domain-Integrated Perspective

Conference Paper (2018)
Author(s)

Ioan Lager (TU Delft - Electrical Engineering Education)

Guy A.E. Vandenbosch (Katholieke Universiteit Leuven)

M Stumpf (Brno University of Technology)

Research Group
Electrical Engineering Education
Copyright
© 2018 I.E. Lager, Guy A.E. Vandenbosch, Martin Stumpf
DOI related publication
https://doi.org/10.23919/EuMC.2018.8541698
More Info
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Publication Year
2018
Language
English
Copyright
© 2018 I.E. Lager, Guy A.E. Vandenbosch, Martin Stumpf
Research Group
Electrical Engineering Education
Pages (from-to)
580-583
ISBN (print)
978-1-5386-5285-5
ISBN (electronic)
978-2-87487-051-4
Reuse Rights

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Abstract

This paper introduces a new paradigm in the electromagnetic (EM) analysis of largely inhomogeneous nanostructures. It is shown that the high degree of inhomogeneity may render the traditional discretisation of such topologies problematic. A new discretisation scheme that is much better matched to these topologies is proposed. The scheme involves a more adequate meshing and discretisation formalism, in conjunction with an original combination of dual space-time EM field quantities to be calculated. The pivotal field equations are elaborately discussed, with an emphasis on their computational implications.

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