Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides

Journal article (2004)

Authors

C Mitterbauer External organisation
C Hebert External organisation
G Kothleitner External organisation
F. Hofer External organisation
P Schattschneider External organisation
H.W. Zandbergen QN/High Resolution Electron Microscopy
Research Group
QN/High Resolution Electron Microscopy
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Published Date

2004

Language

Undefined/Unknown

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Research Group

QN/High Resolution Electron Microscopy