Direct transformation of crystalline MoO3 into few-layers MoS2

Journal Article (2020)
Author(s)

Felix Carrascoso (Instituto de Ciencia de Materiales de Madrid (ICMM))

Gabriel Sanchez-Santolino (Universidad Complutense de Madrid, Instituto de Ciencia de Materiales de Madrid (ICMM))

C. Hsu (TU Delft - QN/van der Zant Lab, Kavli institute of nanoscience Delft)

Norbert M. Nemes (Universidad Complutense de Madrid)

Almudena Torres-Pardo (Universidad Complutense de Madrid)

Patricia Gant (Instituto de Ciencia de Materiales de Madrid (ICMM))

Federico Mompean (Instituto de Ciencia de Materiales de Madrid (ICMM))

Kourosh Kalantar-zadeh (University of New South Wales)

José A. Alonso (Instituto de Ciencia de Materiales de Madrid (ICMM))

More Authors (External organisation)

Research Group
QN/van der Zant Lab
Copyright
© 2020 Felix Carrascoso, Gabriel Sánchez-Santolino, C. Hsu, Norbert M. Nemes, Almudena Torres-Pardo, Patricia Gant, Federico J. Mompeán, Kourosh Kalantar-zadeh, José A. Alonso, More Authors
DOI related publication
https://doi.org/10.3390/ma13102293
More Info
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Publication Year
2020
Language
English
Copyright
© 2020 Felix Carrascoso, Gabriel Sánchez-Santolino, C. Hsu, Norbert M. Nemes, Almudena Torres-Pardo, Patricia Gant, Federico J. Mompeán, Kourosh Kalantar-zadeh, José A. Alonso, More Authors
Research Group
QN/van der Zant Lab
Issue number
10
Volume number
13
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Abstract

We fabricated large-area atomically thin MoS2 layers through the direct transformation of crystalline molybdenum trioxide (MoO3) by sulfurization at relatively low temperatures. The obtained MoS2 sheets are polycrystalline (~10-20 nm single-crystal domain size) with areas of up to 300 × 300 μm2, 2-4 layers in thickness and show a marked p-type behavior. The synthesized films are characterized by a combination of complementary techniques: Raman spectroscopy, X-ray diffraction, transmission electron microscopy and electronic transport measurements.

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