Thermal Stability of MgyTi1-y Thin Films Investigated by Positron Annihilation Spectroscopy

Journal article (2012)
Department
RST/Radiation, Science and Technology (AS) (TU Delft)
Copyright: © 2012 The Author(s)
DOI: https://doi.org/doi:10.1016/j.phpro.2012.06.004
Thin films Mg-Ti alloys Doppler broadening depth profiling Positron annihilation lifetime spectroscopy Ab-initio calculations
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Published Date

31-12-2012

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Source:

Physics Procedia, 35, 2012

ISSN:

1875-3892

Faculty

Applied Sciences

Department

RST/Radiation, Science and Technology

Abstract

Mg-Ti compounds are attractive candidates as hydrogen storage materials for their fast sorption kinetics and high storage capacity. In this context, an investigation of their thermal stability is of great importance. The thermal stability of MgyTi1-y thin films was investigated using positron annihilation spectroscopy. Despite the positive enthalpy of mixing of Mg and Ti, positron Doppler Broadening of Annihilation Radiation (DBAR) depth profiling showed that Mg0.9Ti0.1 films are stable up to 300°C. However, for Mg0.7Ti0.3 films, segregation of Mg and Ti was observed at 300oC by the appearance of a clear Ti signature in the S-W diagrams and in the Doppler broadening depth profiles analyzed using VEPFIT. The thickness of the 250-300 nm thin films remained unchanged during the heating treatments. We further present ab-initio calculations of positron lifetimes of the corresponding metal and metal hydride phases for comparison to our previous positron annihilation lifetime spectroscopy (PALS) study.