Comparison between bulk micromachined and CMOS detectors for x-ray measurements

Conference paper (2003)

Authors

JG Rocha External organisation
CGJ Schabmueller External organisation
NF Ramos External organisation
S Lanceros-Mendez External organisation
MV Moreia External organisation
AGR Evans External organisation
R.F. Wolffenbuttel Electronic Instrumentation - EEMCS
JH Correia External organisation
Research Group
Electronic Instrumentation (EEMCS) (TU Delft)
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Published Date

2003

Language

Undefined/Unknown

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Instrumentation