Identification of time series models from segments - application to scanning transmission electron microscopy images

Journal article (2013)

Authors

J.S. Erkelens OLD Model-based Measurement & Control
A. Tejada Ruiz Mechatronic Systems Design - Mechanical, Maritime and Materials Engineering
A.J. den Dekker Team Michel Verhaegen - Mechanical, Maritime and Materials Engineering
Research Group
OLD Model-based Measurement & Control
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Published Date

2013

Language

English

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Research Group

OLD Model-based Measurement & Control