Semi-analytical modeling of receive transfer function and thermal noise of integrated photonic ultrasound transducers
Sabiju Valiya Valappil (TU Delft - ImPhys/Renaud group)
Peter Harmsma (TNO)
Maurits van der Heiden (TNO)
Martin Verweij (TU Delft - ImPhys/Vos group, TU Delft - ImPhys/Medical Imaging)
Paul van Neer (TNO)
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Abstract
Ultrasound transducers (UTs) are extensively used in several applications across a multitude of disciplines. A new type of UTs namely integrated photonic ultrasound transducers (IPUTs) possess superior performance due to the presence of optical interrogation systems, avoiding electric crosstalk and thermal electronic noise of the sensor. However, a major component of the IPUT's noise floor is its thermal acoustic noise. Several studies have been proposed to characterize IPUTs' behavior; nevertheless, these are either incomplete (model only the thermal noise) or targeted to characterize specific responses such as static behavior, in which the modeled receive transfer function (RTF) is about two orders lower than the experiments. In this study, we develop semi-analytical models based on time-domain finite element analysis and analytical expressions to characterize the RTF and thermal noise-induced noise equivalent pressure of IPUTs. We validate the models by comparing them with the literature, where we obtain a close match between them.
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