Novel dielectric diffusion depth profiling technique for detecting degradation in epoxy coatings

Poster (2004)

Authors

M Giacomelli Old - sect Polymer Materials and Engineering (DCT/PME)
S.J. Picken Old - sect Polymer Materials and Engineering (DCT/PME)
J. van Turnhout Old - sect Polymer Materials and Engineering (DCT/PME)
Research Group
Old - sect Polymer Materials and Engineering (DCT/PME)
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Published Date

2004

Language

Undefined/Unknown

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Research Group

Old - sect Polymer Materials and Engineering (DCT/PME)