Novel dielectric diffusion depth profiling technique for detecting degradation in epoxy coatings
Poster
(2004)
Author(s)
M Giacomelli (TU Delft - Old - sect Polymer Materials and Engineering (DCT/PME))
Stephen J. Picken (TU Delft - Old - sect Polymer Materials and Engineering (DCT/PME))
Jan Van Turnhout (TU Delft - Old - sect Polymer Materials and Engineering (DCT/PME))
Research Group
Old - sect Polymer Materials and Engineering (DCT/PME)
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More Info
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Publication Year
2004
Research Group
Old - sect Polymer Materials and Engineering (DCT/PME)
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