In situ STEM studies of reversible electromigration in thin palladium¿platinum nanobridges
Conference Paper
(2014)
Author(s)
T. Kozlova (TU Delft - QN/High Resolution Electron Microscopy)
M. Rudneva (TU Delft - QN/High Resolution Electron Microscopy)
HW Zandbergen (TU Delft - QN/High Resolution Electron Microscopy)
Research Group
QN/High Resolution Electron Microscopy
To reference this document use:
https://resolver.tudelft.nl/uuid:c05d801e-5868-43b0-8683-a51d3115c60c
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Publication Year
2014
Language
English
Research Group
QN/High Resolution Electron Microscopy
Pages (from-to)
1-2
ISBN (print)
978-80-260-6720-7
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