In situ STEM studies of reversible electromigration in thin palladium¿platinum nanobridges

Conference Paper (2014)
Author(s)

T. Kozlova (TU Delft - QN/High Resolution Electron Microscopy)

M. Rudneva (TU Delft - QN/High Resolution Electron Microscopy)

HW Zandbergen (TU Delft - QN/High Resolution Electron Microscopy)

Research Group
QN/High Resolution Electron Microscopy
More Info
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Publication Year
2014
Language
English
Research Group
QN/High Resolution Electron Microscopy
Pages (from-to)
1-2
ISBN (print)
978-80-260-6720-7

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