SC interface for capacitive and voltage measurements with extended linear range
Conference Paper
(2003)
Author(s)
VP Iordanov (TU Delft - ImPhys/Quantitative Imaging)
GCM Meijer (TU Delft - Electronic Instrumentation)
SN Nihtianov (External organisation)
Research Group
ImPhys/Quantitative Imaging
To reference this document use:
https://resolver.tudelft.nl/uuid:c3d02daa-e47a-48b9-a613-91d33c645a68
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Publication Year
2003
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
195-201
ISBN (print)
90-73461-39-1
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