Numerical Analysis of the MM-Wave Scattering from Randomly Rough Surfaces
Alexander Yarovoy (TU Delft - Microwave Sensing, Signals & Systems)
Wietse Bouwmeester (TU Delft - Microwave Sensing, Signals & Systems)
Elizabeth Rufas (Student TU Delft)
Francesco Fioranelli (TU Delft - Microwave Sensing, Signals & Systems)
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Abstract
A numerical model is developed in the electromagnetic software suite FEKO to simulate scattering from surfaces with pre-defined statistical properties. The model considers surface roughness profile, incident angle and source polarization. Statistical analysis of the scattered field is performed using the Monte Carlo method using full-wave scattering results from a statistical ensemble of rough surface realizations. The performance of the numerical model has been verified in the limiting case of small height and small slope surfaces by comparison with the small perturbation theory. By means of the model proposed, new insight in scattering from statistical surfaces with an averaged surface slope above 0,5 as well as non-Gaussian surface statistics has been obtained.