Defects, a challenge for graphene in flexible electronics
A. J.M. Giesbers (Philips Research)
P. C.P. Bouten (Philips Research)
J. F.M. Cillessen (Philips Research)
L. Van Der Tempel (Philips Research)
J. H. Klootwijk (Philips Research)
A. Pesquera (Graphenea SA)
A. Centeno (Graphenea SA)
A. Zurutuza (Graphenea SA)
A. R. Balkenende (Philips Research)
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Abstract
In this work we present the effect of defects in graphene on its potential for application in flexible electronics. We visualize defects at the grain boundaries, transfer defects and local atomic defects. We show that these defects are currently determining the gas barrier properties of graphene. Under strain up to only 2% we show that these defects lead to cracks in the graphene thereby deteriorating its conductivity.
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