Robustness of attractors in tapping mode atomic force microscopy

Journal article (2019)

Authors

A. Chandrashekar Dynamics of Micro and Nano Systems - Mechanical, Maritime and Materials Engineering
P. Belardinelli Dynamics of Micro and Nano Systems - Mechanical, Maritime and Materials Engineering
U. Staufer Micro and Nano Engineering - Mechanical, Maritime and Materials Engineering
F. Alijani Dynamics of Micro and Nano Systems - Mechanical, Maritime and Materials Engineering
Research Group
Dynamics of Micro and Nano Systems (Mechanical, Maritime and Materials Engineering) (TU Delft)
Copyright: © 2019 A. Chandrashekar, P. Belardinelli, U. Staufer, F. Alijani
DOI
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https://doi.org/10.1007/s11071-019-05037-y
Robustness Atomic force microscopy Basins of attraction Basin erosion Bifurcation chart Dynamical integrity In-contact attractor Integrity profiles Tapping mode
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Published Date

2019

Language

English

Faculty

Mechanical, Maritime and Materials Engineering

Department

Precision and Microsystems Engineering

Research Group

Dynamics of Micro and Nano Systems

Abstract

In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode atomic force microscopy. The numerical model is based on cantilever dynamics driven in the Lennard–Jones potential. Pseudo-arc-length continuation and basins of attraction are utilized to obtain the frequency response and dynamical integrity of the attractors. The global bifurcation and response scenario maps for the system are developed by incorporating several local bifurcation loci in the excitation parameter space. Moreover, the map delineates various escape thresholds for different attractors present in the system. Our work unveils the properties of the cantilever oscillation in proximity to the sample surface, which is governed by the so-called in-contact attractor. The robustness of this attractor against operating parameters is quantified by means of integrity profiles. Our work provides a unique view into global dynamics in tapping mode atomic force microscopy and helps establishing an extended topological view of the system.