Robustness of attractors in tapping mode atomic force microscopy
Abhilash Chandrashekar (TU Delft - Dynamics of Micro and Nano Systems)
P. Belardinelli (TU Delft - Dynamics of Micro and Nano Systems)
U Staufer (TU Delft - Micro and Nano Engineering)
F. Alijani (TU Delft - Dynamics of Micro and Nano Systems)
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Abstract
In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode atomic force microscopy. The numerical model is based on cantilever dynamics driven in the Lennard–Jones potential. Pseudo-arc-length continuation and basins of attraction are utilized to obtain the frequency response and dynamical integrity of the attractors. The global bifurcation and response scenario maps for the system are developed by incorporating several local bifurcation loci in the excitation parameter space. Moreover, the map delineates various escape thresholds for different attractors present in the system. Our work unveils the properties of the cantilever oscillation in proximity to the sample surface, which is governed by the so-called in-contact attractor. The robustness of this attractor against operating parameters is quantified by means of integrity profiles. Our work provides a unique view into global dynamics in tapping mode atomic force microscopy and helps establishing an extended topological view of the system.
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