Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment

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Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment

Journal Article (2017)

Author(s)

Rik V. Mom (Universiteit Leiden)

Willem G. Onderwaater (Universiteit Leiden, European Synchrotron Radiation Facility)

Marcel J. Rost (Universiteit Leiden)

Maciej Jankowski (European Synchrotron Radiation Facility)

Sabine Wenzel (Universiteit Leiden)

Leon Jacobse (Universiteit Leiden)

Paul F.A. Alkemade (TU Delft - QN/Kavli Nanolab Delft, Kavli institute of nanoscience Delft)

Vincent Vandalon (Eindhoven University of Technology)

M. A. van Spronsen (Universiteit Leiden)

Matthijs van Weeren (Universiteit Leiden)

Bert Crama (Universiteit Leiden)

Peter van der Tuijn (Universiteit Leiden, Leiden Probe Microscopy B.V.)

Roberto Felici (European Synchrotron Radiation Facility)

Wilhelmus M.M. Kessels (Eindhoven University of Technology)

Francesco Carlà (European Synchrotron Radiation Facility)

Joost W.M. Frenken (Advanced Research Center for Nanolithography, Universiteit Leiden)

I.A. Groot (Universiteit Leiden)

Research Group

QN/Kavli Nanolab Delft

DOI related publication

https://doi.org/10.1016/j.ultramic.2017.07.011

Synchrotron radiation High-pressure surface science Operando catalysis research Scanning tunneling microscopy

To reference this document use:

https://resolver.tudelft.nl/uuid:c69a11b3-e4c1-4955-83d8-2c4a3965b79b

More Info

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Publication Year

2017

Language

English

Research Group

QN/Kavli Nanolab Delft

Volume number

182

Pages (from-to)

233-242

Abstract

A combined X-ray and scanning tunneling microscopy (STM) instrument is presented that enables the local detection of X-ray absorption on surfaces in a gas environment. To suppress the collection of ion currents generated in the gas phase, coaxially shielded STM tips were used. The conductive outer shield of the coaxial tips can be biased to deflect ions away from the tip core. When tunneling, the X-ray-induced current is separated from the regular, ‘topographic’ tunneling current using a novel high-speed separation scheme. We demonstrate the capabilities of the instrument by measuring the local X-ray-induced current on Au(1 1 1) in 800 mbar Ar.

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