Influence of layout design and on-wafer heatspreaders on the thermal behavior of fully-isolated bipolar transistors: part 1-static analysis
Journal Article
(2010)
Author(s)
S Russo (TU Delft - Old - EWI Sect. Electronics)
L. la Spina (TU Delft - Electronic Components, Technology and Materials)
V d' Alessandro (External organisation)
N Rinaldi (External organisation)
Lis Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Old - EWI Sect. Electronics
DOI related publication
https://doi.org/doi:10.1016/j.sse.2010.03.023
To reference this document use:
https://resolver.tudelft.nl/uuid:c70acfeb-1f7b-4441-9529-8b6a5c1073e1
More Info
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Publication Year
2010
Language
English
Research Group
Old - EWI Sect. Electronics
Issue number
8
Volume number
54
Pages (from-to)
745-753
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