Influence of layout design and on-wafer heatspreaders on the thermal behavior of fully-isolated bipolar transistors: part 1-static analysis

Journal Article (2010)
Authors

S Russo (Old - EWI Sect. Electronics)

L. la Spina (TU Delft - Electronic Components, Technology and Materials)

V d' Alessandro (External organisation)

N Rinaldi (External organisation)

L. K. Nanver (TU Delft - Electronic Components, Technology and Materials)

Research Group
Old - EWI Sect. Electronics
To reference this document use:
https://doi.org/doi:10.1016/j.sse.2010.03.023
More Info
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Publication Year
2010
Language
English
Research Group
Old - EWI Sect. Electronics
Issue number
8
Volume number
54
Pages (from-to)
745-753
DOI:
https://doi.org/doi:10.1016/j.sse.2010.03.023

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