A simplified calibration procedure for on-wafer power levelled S-parameter measurements at mm-wave
Conference Paper
(2015)
Author(s)
S. Galbano (TU Delft - Electronics)
Luca Galatro (TU Delft - Electronics)
Marco Spirito (TU Delft - Electronics)
Research Group
Electronics
DOI related publication
https://doi.org/10.1109/ARFTG.2015.7162908
To reference this document use:
https://resolver.tudelft.nl/uuid:c8cdfc68-181f-40c6-8623-c7634acf2523
More Info
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Publication Year
2015
Language
English
Research Group
Electronics
Bibliographical Note
Harvest@en
Pages (from-to)
1-3
ISBN (print)
978-1-4799-8886-0
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