Vertical SiC taper with a small angle fabricated by slope transfer method

Journal Article (2019)
Authors

Yu Xin (State Key Laboratory of NBC Protection for Civilian, Beijing)

G Pandraud (TU Delft - EKL Processing)

P. J. French (TU Delft - Electronic Instrumentation)

Research Group
EKL Processing
Copyright
© 2019 Yu Xin, G. Pandraud, P.J. French
To reference this document use:
https://doi.org/10.1049/el.2019.0232
More Info
expand_more
Publication Year
2019
Language
English
Copyright
© 2019 Yu Xin, G. Pandraud, P.J. French
Research Group
EKL Processing
Issue number
11
Volume number
55
Pages (from-to)
661-663
DOI:
https://doi.org/10.1049/el.2019.0232
Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Abstract

In this Letter, a slope transfer method to fabricate vertical waveguide couplers is proposed. This method utilises wet etched Si as a mask, and takes advantage of dry etching selectivity between Si and SiC, to successfully transfer the profile from the Si master into SiC. By adopting this method, a <2° slope is achieved. Such a taper can bring the coupling efficiency in SiC waveguides to 80% (around 1 dB loss) or better from around 10% (10 dB loss) without taper. It further increases the alignment tolerance at the same time, which ensures the successful development of a plug-and-play solution for optical sensing. This is the first reported taper made in SiC.