Lumped models for assessment and optimization of bipolar device RF noise performance

Journal article (2013)

Authors

F. Vitale Electronic Components, Technology and Materials - EEMCS
R. van der Toorn Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2013

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials