Lumped models for assessment and optimization of bipolar device RF noise performance
Journal Article
(2013)
Author(s)
F. Vitale (TU Delft - Electronic Components, Technology and Materials)
R. van der Toorn (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/TED.2013.2281237
To reference this document use:
https://resolver.tudelft.nl/uuid:cc0851fd-fc9b-4461-8ea0-9c9cfebbdd34
More Info
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Publication Year
2013
Language
English
Research Group
Electronic Components, Technology and Materials
Issue number
11
Volume number
60
Pages (from-to)
3870-3876
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