Contour-based shape dissimilarity analysis using arc length warping
Conference Paper
(1997)
Author(s)
GWAM van der Heijden (External organisation)
AM Vossepoel (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
To reference this document use:
https://resolver.tudelft.nl/uuid:cc97fe3f-27ad-450f-8992-97c26dd6b6d4
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Publication Year
1997
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
604-615
ISBN (print)
981-02-3258-6
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