Analysis of III-V laye stacks on INP substrates using spectroscopic ellipsometry in the NIR spectral range
Journal Article
(2000)
Author(s)
HG Bukkems (TU Delft - Old - EWI Ch. Photonic Integrated Circuits)
YS Oei (TU Delft - Old - EWI Ch. Photonic Integrated Circuits)
U Richter (External organisation)
B Gruska (External organisation)
Research Group
Old - EWI Ch. Photonic Integrated Circuits
To reference this document use:
https://resolver.tudelft.nl/uuid:cd003426-a01e-435f-ae53-39427f46d8a2
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Publication Year
2000
Research Group
Old - EWI Ch. Photonic Integrated Circuits
Issue number
1
Volume number
364
Pages (from-to)
165-170
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