Analysis of III-V laye stacks on INP substrates using spectroscopic ellipsometry in the NIR spectral range

Journal article (2000)

Authors

HG Bukkems Old - EWI Ch. Photonic Integrated Circuits
YS Oei Old - EWI Ch. Photonic Integrated Circuits
U Richter External organisation
B Gruska External organisation
Research Group
Old - EWI Ch. Photonic Integrated Circuits
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Published Date

2000

Language

Undefined/Unknown

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Research Group

Old - EWI Ch. Photonic Integrated Circuits