34.4: SC interface for capacitive measurements with extended linear range
Conference Paper
(2002)
Author(s)
VP Iordanov (TU Delft - ImPhys/Quantitative Imaging)
GCM Meijer (TU Delft - Electronic Instrumentation)
SN Nihtianov (External organisation)
Research Group
ImPhys/Quantitative Imaging
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https://resolver.tudelft.nl/uuid:cedf3cf0-1a18-4be5-841c-8d84c4bd9dc8
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Publication Year
2002
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
1436-1439
ISBN (print)
0-7803-7454-1
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