High speed wavefront sensorless aberration correction in digital micromirror based confocal microscopy

Journal Article (2017)
Author(s)

Paolo Pozzi (TU Delft - Mechanical Engineering)

Dean Wilding (TU Delft - Mechanical Engineering)

Oleg Soloviev (Flexible Optical B.V., TU Delft - Electrical Engineering, Mathematics and Computer Science, ITMO University, TU Delft - Mechanical Engineering)

Hans Verstraete (TU Delft - Mechanical Engineering)

Laurens Bliek (TU Delft - Mechanical Engineering)

Gleb Vdovine (TU Delft - Mechanical Engineering, ITMO University, Flexible Optical B.V.)

Michel Verhaegen (TU Delft - Mechanical Engineering)

Research Group
Team Raf Van de Plas
DOI related publication
https://doi.org/10.1364/OE.25.000949 Final published version
More Info
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Publication Year
2017
Language
English
Research Group
Team Raf Van de Plas
Issue number
2
Volume number
25
Pages (from-to)
949-959
Downloads counter
210

Abstract

The quality of fluorescence microscopy images is often impaired by the presence
of sample induced optical aberrations. Adaptive optical elements such as deformable mirrors or spatial light modulators can be used to correct aberrations. However, previously reported techniques either require special sample preparation, or time consuming optimization procedures for the correction of static aberrations. This paper reports a technique for optical sectioning fluorescence microscopy capable of correcting dynamic aberrations in any fluorescent sample during the acquisition. This is achieved by implementing adaptive optics in a non conventional confocal microscopy setup, with multiple programmable confocal apertures, in which out of focus light can be separately detected, and used to optimize the correction performance with a sampling frequency an order of magnitude faster than the imaging rate of the system. The
paper reports results comparing the correction performances to traditional image optimization algorithms, and demonstrates how the system can compensate for dynamic changes in the aberrations, such as those introduced during a focal stack acquisition though a thick sample.