Analytical Electron Microscopy by scanning in Fourier space
Conference Paper
(1996)
Author(s)
BM Mertens (TU Delft - ImPhys/Charged Particle Optics)
P. Kruit (TU Delft - ImPhys/Charged Particle Optics)
Research Group
ImPhys/Charged Particle Optics
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https://resolver.tudelft.nl/uuid:d06010b1-b595-4711-ab26-46c6c0a330c4
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Publication Year
1996
Research Group
ImPhys/Charged Particle Optics
Bibliographical Note
ISSN 1381-1371@en
Pages (from-to)
148-150
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