Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

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Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

Conference Paper (2018)

Author(s)

F. Mubarak (VSL Dutch Metrology Institute)

V. Mascolo (VSL Dutch Metrology Institute)

G. Rietveld (VSL Dutch Metrology Institute)

M. Spirito (TU Delft - Electrical Engineering, Mathematics and Computer Science)

K. Daffe (IEMN Institut d'Electronique de Microelectronique et de Nanotechnologie)

K. Haddadi (IEMN Institut d'Electronique de Microelectronique et de Nanotechnologie)

Research Group

Electronics

Nanostructures EM simulation Measurement uncertainty Traceability Precision measurements Co-planar waveguide On-wafer calibration VNA

DOI related publication

https://doi.org/10.1109/CPEM.2018.8500810 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:d0a81e74-340c-4e78-9c0e-92ac8f8dd3da

More Info

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Publication Year

2018

Language

English

Research Group

Electronics

Article number

8500810

ISBN (electronic)

978-1-5386-0973-6

Event

2018 Conference on Precision Electromagnetic Measurements, CPEM 2018 (2018-07-08 - 2018-07-13), Paris, France

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Abstract

Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.