Hydrogenography of PdHx thin films

Influence of H-induced stress relaxation processes

Journal Article (2009)
Author(s)

R. Gremaud (Swiss Federal Laboratories for Materials Science and Technology (Empa), Vrije Universiteit Amsterdam)

M. Gonzalez-Silveira (Vrije Universiteit Amsterdam)

Y. Pivak (Vrije Universiteit Amsterdam)

S. de Man (Vrije Universiteit Amsterdam)

M. Slaman (Vrije Universiteit Amsterdam)

H. Schreuders (Vrije Universiteit Amsterdam)

B. Dam (Vrije Universiteit Amsterdam)

R. Griessen (Vrije Universiteit Amsterdam)

DOI related publication
https://doi.org/10.1016/j.actamat.2008.11.016 Final published version
More Info
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Publication Year
2009
Language
English
Journal title
Acta Materialia
Issue number
4
Volume number
57
Pages (from-to)
1209-1219
Downloads counter
111

Abstract

Hydrogenography is a new optical thin film combinatorial method that follows hydrogenation and determines its associated thermodynamic properties. Due to clamping to the substrate, stresses generated in thin films are larger than in bulk. This must be taken into account for a comparison between these two types of systems. In this article, we follow the microstructure, surface morphology and in-plane stress changes of thin polycrystalline PdHx films upon several hydrogen ab/desorption cycles and correlate them to the evolution in shape and hysteresis of pressure-optical transmission isotherms (PTIs) recorded by hydrogenography. The in-plane stress in the first instance is relaxed inhomogeneously by buckling, and a more complete, homogeneous relaxation is only reached after the creation of a buckle-and-crack network that is the two-dimensional analogue of bulk decrepitated grains. This sequence of changes is clearly visible in the PTIs, demonstrating another useful facet of hydrogenography for characterizing metal-hydrogen systems.