Electrical performance assessment and optimization of an RF-MEMS wafer-level package
Conference Paper
(2006)
Author(s)
J Iannacci (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
J Tian (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
A.B. Akhnoukh (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
M Bartek (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
R Gaddi (External organisation)
A Gnudi (External organisation)
Research Group
Old - EWI Ch. Integrated Sensing Devices
To reference this document use:
https://resolver.tudelft.nl/uuid:d3181558-2606-4f11-b5c8-a4321455492f
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Publication Year
2006
Research Group
Old - EWI Ch. Integrated Sensing Devices
Pages (from-to)
512-518
ISBN (print)
90-73461-44-8
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