Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework
Journal Article
(2005)
Author(s)
AJ den Dekker (TU Delft - DISC)
S van Aert (TU Delft - DISC)
A van den Bos (ImPhys/Acoustical Wavefield Imaging )
Research Group
DISC
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https://resolver.tudelft.nl/uuid:d54c943c-8c37-4668-bc4f-efc339973c12
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Publication Year
2005
Research Group
DISC
Issue number
2
Volume number
104
Pages (from-to)
83-106
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