High-Resolution Electron Microscopy: From Imaging Toward Measuring

van Aert, S; den Dekker, A.J.; van den Bos, A; Van Dyck, D

High-Resolution Electron Microscopy: From Imaging Toward Measuring

Journal article (2002)

Authors

S van Aert Old - sect Systems, Signals and control Group (IST/MMR)

A.J. den Dekker Old - sect Systems, Signals and control Group (IST/MMR)

A van den Bos Old - sect Systems, Signals and control Group (IST/MMR)

D Van Dyck External organisation

Research Group

Old - sect Systems, Signals and control Group (IST/MMR)

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Published Date

2002

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Research Group

Old - sect Systems, Signals and control Group (IST/MMR)