Influence of film growth conditions on the transport properties of YBa2Cu3O7-δ step-edge junctions

None, None; None, None; None, None; None, None; None, None; None, None; None, None; None, None; None, None

Influence of film growth conditions on the transport properties of YBa2Cu3O7-δ step-edge junctions

Journal Article (1997)

Author(s)

F. G. Hill (Bergische Universität Wuppertal )

M. Getta (Bergische Universität Wuppertal )

M. A. Hein (Bergische Universität Wuppertal )

G. Müller (Bergische Universität Wuppertal )

H. Piel (Bergische Universität Wuppertal )

B. Dam (Vrije Universiteit Amsterdam)

S. Beuven (Forschungszentrum Jülich)

J. Schubert (Forschungszentrum Jülich)

W. Zander (Forschungszentrum Jülich)

DOI related publication

https://doi.org/10.1016/S0964-1807(97)00053-7 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:d726c2fa-48c4-432c-be0e-796531cc6738

More Info

expand_more

Publication Year

1997

Language

English

Journal title

Applied Superconductivity

Issue number

7-12

Volume number

5

Pages (from-to)

249-254

Downloads counter

52

Abstract

In order to investigate the influence of film growth conditions on the transport properties of step-edge junctions, YBa2Cu3O7-δ films were deposited on high-quality substrate steps by DC-sputtering at two different substrate temperatures and by off-axis laser ablation. RSJ-like junction properties and a low (1σ)-spread of the critical current density Jc (4.2 K) of 17% along one step were obtained for laserablated junctions. The transport properties of the differently prepared junctions correlated with the microstructure of the step region. This, in turn, might result from the large differences in surface diffusion during film growth.