Measurement of the resonant-polaron effect in the reststrahlen band of GaAs:Si using two-photon excitation

Journal article (1996)

Authors

P.C.M. Planken Old - sect Terahertz Imaging (IST/TI)
HPM Pellemans Old organisation TN/TechnischeNatuurkunde voorm
CJGM Langerak External organisation
PC van Son Old organisation TN/TechnischeNatuurkunde voorm
J.N. Hovenier Old - sect Terahertz Imaging (IST/TI)
TO Klaassen Old - sect Terahertz Imaging (IST/TI)
WT Wenckebach Old - sect Terahertz Imaging (IST/TI)
PW Barmby External organisation
JL Dunn External organisation
CA Bates External organisation
CT Foxon External organisation
Research Group
Old - sect Terahertz Imaging (IST/TI)
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Published Date

1996

Language

Undefined/Unknown

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Research Group

Old - sect Terahertz Imaging (IST/TI)