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Measurement of the resonant-polaron effect in the reststrahlen band of GaAs:Si using two-photon excitation

Journal article (1996)

Authors

P. C.M. Planken Old - sect Terahertz Imaging (IST/TI)
HPM Pellemans Old organisation TN/TechnischeNatuurkunde voorm
PC van Son Old organisation TN/TechnischeNatuurkunde voorm
JN Hovenier Old - sect Terahertz Imaging (IST/TI)
T. O. Klaassen Old - sect Terahertz Imaging (IST/TI)
WT Wenckebach Old - sect Terahertz Imaging (IST/TI)
PW Barmby External organisation
JL Dunn External organisation
CA Bates External organisation
CT Foxon External organisation
CJGM Langerak External organisation
Research Group
Old - sect Terahertz Imaging (IST/TI)
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Published Date

1996

Language

Undefined/Unknown

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Research Group

Old - sect Terahertz Imaging (IST/TI)

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