Technological challenges in defect detection for metal strip; pattern recognition algorithms
Conference Paper
(1999)
Author(s)
Pieter P. Jonker (TU Delft - ImPhys/Quantitative Imaging)
Bob Duin (TU Delft - ImPhys/Quantitative Imaging)
D. de Ridder (TU Delft - ImPhys/Quantitative Imaging)
R. Ligteringen (TU Delft - ImPhys/Quantitative Imaging)
D.M.J. Tax (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
To reference this document use:
https://resolver.tudelft.nl/uuid:dd83e3ec-ca32-4119-aff7-f5032a578dca
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Publication Year
1999
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
38-40
ISBN (print)
geen
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