Influence of transients on breakdown probability of fixed defects in SF6
Conference Paper
(2004)
Author(s)
S. Meijer (OLD High-Voltage Technology and Management)
RGA Zoetmulder (OLD High-Voltage Technology and Management)
J.J. Smit (OLD High-Voltage Technology and Management)
OLD High-Voltage Technology and Management
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Publication Year
2004
OLD High-Voltage Technology and Management
Pages (from-to)
1-6
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