High-resolution EELS study of the vacancy-doped metal/insulator system, Nd1-xTiO3, x=0 to 0.33.
Journal Article
(2005)
Author(s)
AS Sefat (External organisation)
G Amow (External organisation)
MY Wu (QN/High Resolution Electron Microscopy)
GA Botton (External organisation)
JE Greedan (External organisation)
QN/High Resolution Electron Microscopy
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Publication Year
2005
QN/High Resolution Electron Microscopy
Issue number
4
Volume number
178
Pages (from-to)
1008-1016
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