Linear-defect induced thermal instability in YBCO thin films in microwave fields

Journal article (2003)

Authors

V.M. Pan External organisation
C.G. Tretiatchenko External organisation
VS Flis External organisation
VA Komashko External organisation
OA Kalenyuk External organisation
EA Pashitskij External organisation
AN Ivanyuta External organisation
GA Melkov External organisation
H.W. Zandbergen QN/High Resolution Electron Microscopy
Research Group
QN/High Resolution Electron Microscopy
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Published Date

2003

Language

Undefined/Unknown

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Research Group

QN/High Resolution Electron Microscopy