A Study on Fault-Tolerant Circuits using Redundancy
Conference Paper
(2003)
Author(s)
J Han (TU Delft - ImPhys/Quantitative Imaging)
P.P. Jonker (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
To reference this document use:
https://resolver.tudelft.nl/uuid:ea6f9261-5ef6-4e1c-ba3b-3c4a03159663
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Publication Year
2003
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
65-69
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