Analysis of residual errors due to calibration transfer in on-wafer measurements at mm-wave frequencies

Conference Paper (2015)

Author(s)

Luca Galatro (TU Delft - Electronics)

Marco Spirito (TU Delft - Electronics)

Research Group

Electronics

DOI related publication

https://doi.org/10.1109/BCTM.2015.7340569

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Publication Year

2015

Language

English

Research Group

Electronics

Bibliographical Note

harvest@en

Pages (from-to)

141-144

ISBN (print)

978-1-4673-8551-0

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