3D Simulation Study of Strained CMOS based on a disposable SiGe Dot Technology
Conference Paper
(2007)
Author(s)
S Fregonese (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
Y Zhuang (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
J Burghartz (External organisation)
Research Group
Old - EWI Ch. Integrated Sensing Devices
To reference this document use:
https://resolver.tudelft.nl/uuid:eb60f8d5-7475-413c-8fd0-a2d06fc4b746
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Publication Year
2007
Research Group
Old - EWI Ch. Integrated Sensing Devices
Pages (from-to)
1-4
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