System Performance of a TDM Test-Bed with Long Flex Harness Toward the New X-IFU FPA-DM
D. Vaccaro (SRON–Netherlands Institute for Space Research)
M. de Wit (SRON–Netherlands Institute for Space Research)
J. van der Kuur (SRON–Netherlands Institute for Space Research)
L. Gottardi (SRON–Netherlands Institute for Space Research)
K. Ravensberg (SRON–Netherlands Institute for Space Research)
S. R. Bandler (NASA Goddard Space Flight Center)
B. Jackson (SRON–Netherlands Institute for Space Research)
J. R. Gao (TU Delft - ImPhys/Adam group, SRON–Netherlands Institute for Space Research)
J. W.A. den Herder (Universiteit van Amsterdam, SRON–Netherlands Institute for Space Research)
undefined More Authors (External organisation)
More Info
expand_more
Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.
Abstract
SRON (Netherlands Institute for Space Research) is developing the focal plane assembly (FPA) for Athena X-IFU, whose demonstration model (DM) will use for the first time a time domain multiplexing (TDM)-based readout system for the on-board transition-edge sensors (TES). We report on the characterization activities on a TDM setup provided by NASA goddard space flight center (GSFC) and national institute for standards and technology (NIST) and tested in SRON cryogenic test facilities. The goal of these activities is to study the impact of the longer harness, closer to X-IFU specs, in a different EMI environment and switching from a single-ended to a differential readout scheme. In this contribution we describe the advancement in the debugging of the system in the SRON cryostat, which led to the demonstration of the nominal spectral performance of 2.8 eV at 5.9 keV with 16-row multiplexing, as well as an outlook for the future endeavors for the TDM readout integration on X-IFU’s FPA-DM at SRON.